Rounding error effects in the presence of underlying measurement error

被引：0
|
作者：
Tom Burr
Stephen Croft
Michael S. Hamada
Stephen Vardeman
Brian Weaver
机构：
[1] Statistical Sciences,Statistics and Industrial Engineering
[2] Los Alamos National Laboratory,undefined
[3] Safeguards Science and Technology,undefined
[4] Los Alamos National Laboratory,undefined
[5] Iowa State University,undefined
来源：
Accreditation and Quality Assurance | 2012年 / 17卷
关键词：
Bayesian methods; Effective random error variance; Instrument resolution; Item-specific bias; Likelihood;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A previous related paper considered rounding error effects in the presence of underlying measurement error and presented a Bayesian approach to estimate instrument input random error standard deviation. This addendum to the previous paper emphasizes that the effects of random error depend on the true (and usually unknown) value of the measurand, in terms of both the variance and the item-specific bias. However, it is shown that if we assume that the true values are uniformly distributed, then instrument variance and item-specific bias can be combined into an “effective random error variance” and a strategy to estimate the effective random error variance is provided.
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收藏
页码：485 / 490
页数：5
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