Advanced Nanoscale Characterization of Cement Based Materials Using X-Ray Synchrotron Radiation: A Review

被引:0
|
作者
Sejung R. Chae
Juhyuk Moon
Seyoon Yoon
Sungchul Bae
Pierre Levitz
Robert Winarski
Paulo J. M. Monteiro
机构
[1] University of California at Berkeley,Department of Civil and Environmental Engineering
[2] CNRS,Laboratory PECSA
[3] Université Pierre et Marie Curie,undefined
[4] Center for Nanaoscale Materials,undefined
[5] Argonne National Laboratory,undefined
关键词
X-ray; microscopy; tomography; STXM; X-ray diffraction; high pressure; tobermorite; CSH; fly ash;
D O I
暂无
中图分类号
学科分类号
摘要
We report various synchrotron radiation laboratory based techniques used to characterize cement based materials in nanometer scale. High resolution X-ray transmission imaging combined with a rotational axis allows for rendering of samples in three dimensions revealing volumetric details. Scanning transmission X-ray microscope combines high spatial resolution imaging with high spectral resolution of the incident beam to reveal X-ray absorption near edge structure variations in the material nanostructure. Microdiffraction scans the surface of a sample to map its high order reflection or crystallographic variations with a micron-sized incident beam. High pressure X-ray diffraction measures compressibility of pure phase materials. Unique results of studies using the above tools are discussed—a study of pores, connectivity, and morphology of a 2,000 year old concrete using nanotomography; detection of localized and varying silicate chain depolymerization in Al-substituted tobermorite, and quantification of monosulfate distribution in tricalcium aluminate hydration using scanning transmission X-ray microscopy; detection and mapping of hydration products in high volume fly ash paste using microdiffraction; and determination of mechanical properties of various AFm phases using high pressure X-ray diffraction.
引用
收藏
页码:95 / 110
页数:15
相关论文
共 50 条
  • [1] Advanced Nanoscale Characterization of Cement Based Materials Using X-Ray Synchrotron Radiation: A Review
    Chae, Sejung R.
    Moon, Juhyuk
    Yoon, Seyoon
    Bae, Sungchul
    Levitz, Pierre
    Winarski, Robert
    Monteiro, Paulo J. M.
    [J]. INTERNATIONAL JOURNAL OF CONCRETE STRUCTURES AND MATERIALS, 2013, 7 (02) : 95 - 110
  • [2] Evaluation of tortuosity of cement-based materials with X-ray synchrotron radiation microtomography
    Promentilla, Michael Angelo B.
    Sugiyama, Takafumi
    [J]. PROCEEDINGS OF THE FIRST INTERNATIONAL CONFERENCE ON RECENT ADVANCES IN CONCRETE TECHNOLOGY, 2007, : 101 - 112
  • [3] Devices, Materials, and Processes for Nanoelectronics: Characterization with Advanced X-Ray Techniques Using Lab-Based and Synchrotron Radiation Sources
    Zschech, Ehrenfried
    Wyon, Christophe
    Murray, Conal E.
    Schneider, Gerd
    [J]. ADVANCED ENGINEERING MATERIALS, 2011, 13 (08) : 811 - 836
  • [4] Residual stress characterization of Al/SiC nanoscale multilayers using X-ray synchrotron radiation
    Singh, D. R. P.
    Deng, X.
    Chawla, N.
    Bai, J.
    Hubbard, C.
    Tang, G.
    Shen, Y-L
    [J]. THIN SOLID FILMS, 2010, 519 (02) : 759 - 765
  • [5] Review on applications of synchrotron-based X-ray techniques in materials characterization
    Sedigh Rahimabadi, Pooria
    Khodaei, Mehdi
    Koswattage, Kaveenga R.
    [J]. X-RAY SPECTROMETRY, 2020, 49 (03) : 348 - 373
  • [6] Matrix characterization using synchrotron radiation X-ray diffraction
    Barroso, RC
    Anjos, MJ
    Lopes, RT
    de Jesus, EFO
    Simabuco, SM
    Braz, D
    Castro, CRF
    [J]. RADIATION PHYSICS AND CHEMISTRY, 2001, 61 (3-6) : 739 - 741
  • [7] Nanoscale grating characterization using EUV scatterometry and soft x-ray scattering with plasma and synchrotron radiation
    Lohr, Leonhard M.
    Ciesielski, Richard
    Glabisch, Sven
    Schroder, Sophia
    Brose, Sascha
    Soltwisch, Victor
    [J]. APPLIED OPTICS, 2023, 62 (01) : 117 - 132
  • [8] REVIEW OF X-RAY FLUORESCENT ANALYSIS USING SYNCHROTRON RADIATION
    BARYSHEV, VB
    KULIPANOV, GN
    SKRINSKY, AN
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1986, 246 (1-3): : 739 - 750
  • [9] CHARACTERIZATION OF X-RAY OPTICS BY SYNCHROTRON RADIATION
    KUHNE, M
    MULLER, P
    [J]. X-RAY INSTRUMENTATION IN MEDICINE AND BIOLOGY, PLASMA PHYSICS, ASTROPHYSICS, AND SYNCHROTRON RADIATION, 1989, 1140 : 220 - 225
  • [10] CHARACTERIZATION OF A SOURCE OF X-RAY SYNCHROTRON RADIATION
    LAUNDY, D
    CUMMINGS, S
    PATTISON, P
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1991, 302 (03): : 553 - 557