Some aspects of reflection crystal optics

The general case of light reflection from a crystal of arbitrary symmetry in the weak anisotropy approximation has been considered. The dependence of the components of reflection matrix for a crystal with an arbitrary dielectric tensor is obtained for the case of small anisotropic corrections. The measurement of the reflection matrix components and the possibilities of subsequently determining the dielectric tensor components in measurements at different crystal orientations with the application of an ellipsometric experiment are analyzed. It is shown how the method proposed can be used to determine the characteristics of uniaxial and biaxial crystals at an arbitrary orientation of optical axes.