Automatic anomaly detection in engineering diagrams using machine learning

被引:0
|
作者
Ho-Jin Shin
Ga-Young Lee
Chul-Jin Lee
机构
[1] Chung-Ang University,School of Chemical Engineering and Materials Science
[2] Chung-Ang University,Department of Intelligent Energy and Industry
来源
关键词
Engineering Diagram; Objective Detection; Graph Pattern Mining; Support Vector Machine; Piping and Instrumentation Diagram;
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学科分类号
摘要
This study implements a method of automating anomaly detection in engineering diagrams by extracting patterns within graphs after recognizing graphs from a piping and instrumentation diagram (P&ID). The framework consists of three parts: graph generation, subgraph extraction, and graph classification. Graphs are generated through symbol recognition and line recognition, and subgraphs are extracted using the frequent subgraph mining algorithm. The graph classification targets are divided into two categories according to the frequency of the main equipment of the extracted subgraph. If the frequency is low, it is classified through whether to include a user-defined subgraph, and if it is high, it is trained in a support vector machine (SVM) algorithm after vector embedding to generate a classification model. K-fold cross-validation is also applied to increase classification accuracy. The proposed framework shows 85% accuracy for a given test drawing through cross-validation. These outcomes contribute to the field of engineering diagram analysis and have potential applications in plant industries.
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页码:2612 / 2623
页数:11
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