Characterizing wear processes on orthopaedic materials using scanning probe microscopy

被引：0
|
作者：
P.A. Campbell
B. O’Rourke
P. Dawson
R.J. Turner
D.G. Walmsley
P.L. Spedding
E.P. Watters
机构：
[1] Department of Pure and Applied Physics,
[2] Northern Ireland Centre for Advanced Materials,undefined
[3] The Queen’s University of Belfast,undefined
[4] Belfast BT7 1NN,undefined
[5] Northern Ireland,undefined
[6] Department of Chemical Engineering,undefined
[7] The Queen’s University of Belfast,undefined
[8] Belfast BT7 1NN,undefined
[9] Northern Ireland,undefined
[10] Orthopaedic Research Unit,undefined
[11] Musgrave Park Hospital,undefined
[12] Belfast BT11,undefined
[13] Northern Ireland,undefined
来源：
Applied Physics A | 1998年 / 66卷
关键词：
PACS: 61.16.Ch; 68.35.Bs; 68.35.Ct;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：S867 / S871
相关论文
共 50 条
  • [1] Characterizing wear processes on orthopaedic materials using scanning probe microscopy
    Campbell, PA
    O'Rourke, B
    Dawson, P
    Turner, RJ
    Walmsley, DG
    Spedding, PL
    Watters, EP
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S867 - S871
  • [2] Characterizing wear processes on orthopaedic materials using scanning probemicroscopy
    Campbell, P.A.
    O'Rourke, B.
    Dawson, P.
    Turner, R.J.
    Walmsley, D.G.
    Spedding, P.L.
    Watters, E.P.
    [J]. Applied Physics A: Materials Science and Processing, 1998, 66 (SUPPL. 1):
  • [3] Friction, wear, lubrication, and materials characterization using scanning probe microscopy
    Bhushan, B
    [J]. FUNDAMENTALS OF TRIBOLOGY AND BRIDGING THE GAP BETWEEN THE MACRO-AND MICRO/NANOSCALES, 2001, 10 : 13 - 39
  • [4] Anisotropy in wear processes measured by scanning probe microscopy
    Schouterden, Kris
    Lairson, Bruce M.
    [J]. Thin Solid Films, 340 (01): : 40 - 44
  • [5] Anisotropy in wear processes measured by scanning probe microscopy
    Schouterden, K
    Lairson, BM
    [J]. THIN SOLID FILMS, 1999, 340 (1-2) : 40 - 44
  • [6] Scanning probe microscopy based characterization of battery materials, interfaces, and processes
    Kempaiah, Ravindra
    Vasudevamurthy, Gokul
    Subramanian, Arunkumar
    [J]. NANO ENERGY, 2019, 65
  • [7] Investigation of silicon device processes using scanning probe microscopy
    Radhakrishnan, MK
    Lee, YP
    Poenar, DP
    Chai, TC
    Natarajan, M
    [J]. 1997 21ST INTERNATIONAL CONFERENCE ON MICROELECTRONICS - PROCEEDINGS, VOLS 1 AND 2, 1997, : 645 - 648
  • [8] Scanning probe Microscopy in materials science
    Meyer, E
    Jarvis, SR
    Spencer, ND
    [J]. MRS BULLETIN, 2004, 29 (07) : 443 - 448
  • [9] Scanning Probe Microscopy in Materials Science
    Ernst Meyer
    Suzanne P. Jarvis
    Nicholas D. Spencer
    [J]. MRS Bulletin, 2004, 29 : 443 - 448
  • [10] Nano- to microscale wear and mechanical characterization using scanning probe microscopy
    Bhushan, B
    [J]. WEAR, 2001, 251 : 1105 - 1123
12345