Optical metrology for digital manufacturing: a review

被引:0
|
作者
Sofia Catalucci
Adam Thompson
Samanta Piano
David T. Branson
Richard Leach
机构
[1] University of Nottingham,Manufacturing Metrology Team, Faculty of Engineering
关键词
Optical metrology; Digital manufacturing; Industry 4.0; Measurement uncertainty;
D O I
暂无
中图分类号
学科分类号
摘要
With the increasing adoption of Industry 4.0, optical metrology has experienced a significant boom in its implementation, as an ever-increasing number of manufacturing processes are overhauled for in-process measurement and control. As such, optical metrology for digital manufacturing is currently a hot topic in manufacturing research. Whilst contact coordinate measurement solutions have been adopted for many years, the current trend is to increasingly exploit the advantages given by optical measurement technologies. Smart automated non-contact inspection devices allow for faster cycle times, reducing the inspection time and having a continuous monitoring of process quality. In this paper, a review for the state of the art in optical metrology is presented, highlighting the advantages and impacts of the integration of optical coordinate and surface texture measurement technologies in digital manufacturing processes. Also, the range of current software and hardware technologies for digital manufacturing metrology is discussed, as well as strategies for zero-defect manufacturing for greater sustainability, including examples and in-depth discussions of additive manufacturing applications. Finally, key current challenges are identified relating to measurement speed and data-processing bottlenecks; geometric complexity, part size and surface texture; user-dependent constraints, harsh environments and uncertainty evaluation.
引用
收藏
页码:4271 / 4290
页数:19
相关论文
共 50 条
  • [1] Optical metrology for digital manufacturing: a review
    Catalucci, Sofia
    Thompson, Adam
    Piano, Samanta
    Branson, David T., III
    Leach, Richard
    [J]. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2022, 120 (7-8): : 4271 - 4290
  • [2] An insight into optical metrology in manufacturing
    Shimizu, Yuki
    Chen, Liang-Chia
    Kim, Dae Wook
    Chen, Xiuguo
    Li, Xinghui
    Matsukuma, Hiraku
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2021, 32 (04)
  • [3] Review of surface metrology artifacts for additive manufacturing
    Mietliński, Patryk
    Gapiński, Bartosz
    Krolczyk, Jolanta B.
    Nieslony, Piotr
    Bogdan-Chudy, Marta
    Trych-Wildner, Anna
    Wojciechowska, Natalia
    Krolczyk, Grzegorz M.
    Wieczorowski, Michal
    Bartkowiak, Tomasz
    [J]. Bulletin of the Polish Academy of Sciences: Technical Sciences, 2024, 72 (06)
  • [4] Coordinate metrology, tactile and optical - digital by nature
    Imkamp, Dietrich
    Tutsch, Rainer
    [J]. TM-TECHNISCHES MESSEN, 2019, 86 (09) : 450 - 463
  • [5] Education and training in coordinate metrology for industry towards digital manufacturing
    Rocha, L.
    Savio, E.
    Marxer, M.
    Ferreira, F.
    [J]. 2017 JOINT IMEKO TC1-TC7-TC13 SYMPOSIUM: MEASUREMENT SCIENCE CHALLENGES IN NATURAL AND SOCIAL SCIENCES, 2018, 1044
  • [6] Deep learning in optical metrology: a review
    Zuo, Chao
    Qian, Jiaming
    Feng, Shijie
    Yin, Wei
    Li, Yixuan
    Fan, Pengfei
    Han, Jing
    Qian, Kemao
    Chen, Qian
    [J]. LIGHT-SCIENCE & APPLICATIONS, 2022, 11 (01)
  • [7] Deep learning in optical metrology: a review
    Chao Zuo
    Jiaming Qian
    Shijie Feng
    Wei Yin
    Yixuan Li
    Pengfei Fan
    Jing Han
    Kemao Qian
    Qian Chen
    [J]. Light: Science & Applications, 11
  • [8] Optical metrology at the Optical Sciences Center: an historical review
    Creath, Katherine
    Parks, Robert E.
    [J]. FIFTY YEARS OF OPTICAL SCIENCES AT THE UNIVERSITY OF ARIZONA, 2014, 9186
  • [9] Review of production of microfluidic devices: material, manufacturing and metrology
    Li, Shiguang
    Xu, Zhiguang
    Mazzeo, Aaron
    Burns, Daniel J.
    Fu, Gang
    Dirckx, Matthew
    Shilpiekandula, Vijay
    Chen, Xing
    Nayak, Nimai C.
    Wong, Eehern
    Yoon, Soon Fatt
    Fang, Zhong Ping
    Youcef-Toumi, Kamal
    Hardt, David
    Tor, Shu Beng
    Yue, Chee Yoon
    Chun, Jung-Hoon
    [J]. MEMS, MOEMS, AND MICROMACHING III, 2008, 6993
  • [10] Surface texture metrology for metal additive manufacturing: a review
    Townsend, A.
    Senin, N.
    Blunt, L.
    Leach, R. K.
    Taylor, J. S.
    [J]. PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2016, 46 : 34 - 47