Combination of Universal Mechanical Testing Machine with Atomic Force Microscope for Materials Research

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作者
Jian Zhong
Dannong He
机构
[1] National Engineering Research Center for Nanotechnology,
[2] School of Materials Science and Engineering,undefined
[3] Shanghai Jiao Tong University,undefined
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摘要
Surface deformation and fracture processes of materials under external force are important for understanding and developing materials. Here, a combined horizontal universal mechanical testing machine (HUMTM)-atomic force microscope (AFM) system is developed by modifying UMTM to combine with AFM and designing a height-adjustable stabilizing apparatus. Then the combined HUMTM-AFM system is evaluated. Finally, as initial demonstrations, it is applied to analyze the relationship among macroscopic mechanical properties, surface nanomorphological changes under external force and fracture processes of two kinds of representative large scale thin film materials: polymer material with high strain rate (Parafilm) and metal material with low strain rate (aluminum foil). All the results demonstrate the combined HUMTM-AFM system overcomes several disadvantages of current AFM-combined tensile/compression devices including small load force, incapability for large scale specimens, disability for materials with high strain rate and etc. Therefore, the combined HUMTM-AFM system is a promising tool for materials research in the future.
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