Digital image splicing detection technique using optimal threshold based local ternary pattern

被引:0
|
作者
Navdeep Kanwal
Akshay Girdhar
Lakhwinder Kaur
Jaskaran S. Bhullar
机构
[1] I.K.G. PTU,Department of IT
[2] Guru Nanak Dev Engineering College,Department of Computer Engineering
[3] Punjabi University,undefined
[4] M.I.M.I.T,undefined
来源
关键词
Forgery detection; Image splicing; Local ternary pattern; SVM;
D O I
暂无
中图分类号
学科分类号
摘要
Digital images were considered as authentic proof of evidence some years ago but advancement in technology has made image tampering an easy task for every user. Investigation of the digital images for forgery detection, and authenticate their genuineness is need of the hour. To address this issue, the paper proposes a new block-based technique for image splicing detection. In this technique, first the image is converted to YCbCr format and chrominance component of the image is extracted. This component is segmented in overlapping blocks to extract local features. The paper proposes to use a new texture descriptor named as otsu based enhanced local ternary pattern (OELTP) for feature extraction from these blocks. OELTP uses an optimal threshold value to improve the enhanced local ternary pattern (ELTP) texture descriptor, for better detection of image forgery. Further, the paper proposes to use energy for reducing dimensionality of features, instead of using complex computations as used in earlier techniques. Finally, the features are sorted for speedy classification and fed to support vector machine (SVM) for labelling the images either as authentic or forged. The proposed technique has been tested on varying groups of data from the benchmark dataset(s) and has achieved an accuracy upto 98.25%. To demonstrate the superiority of proposed technique, results are also compared with the state-of-the-art techniques.
引用
收藏
页码:12829 / 12846
页数:17
相关论文
共 50 条
  • [1] Digital image splicing detection technique using optimal threshold based local ternary pattern
    Kanwal, Navdeep
    Girdhar, Akshay
    Kaur, Lakhwinder
    Bhullar, Jaskaran S.
    [J]. MULTIMEDIA TOOLS AND APPLICATIONS, 2020, 79 (19-20) : 12829 - 12846
  • [2] A dynamic threshold-based local mesh ternary pattern technique for biomedical image retrieval
    Srivastava, Varun
    Purwar, Ravindra K.
    Jain, Anchal
    [J]. INTERNATIONAL JOURNAL OF IMAGING SYSTEMS AND TECHNOLOGY, 2019, 29 (02) : 168 - 179
  • [3] Splicing Image Forgery Detection Based on DCT and Local Binary Pattern
    Alahmadi, Amani A.
    Hussain, Muhammad
    Aboalsamh, Hatim
    Muhammad, Ghulam
    Bebis, George
    [J]. 2013 IEEE GLOBAL CONFERENCE ON SIGNAL AND INFORMATION PROCESSING (GLOBALSIP), 2013, : 253 - 256
  • [4] Frequency based Digital Image Forgery Detection Through Optimal Threshold Using SOELTP
    Srivastava, Vikas
    Yadav, Sanjay Kumar
    [J]. EAI ENDORSED TRANSACTIONS ON SCALABLE INFORMATION SYSTEMS, 2022, 9 (04):
  • [6] Image Splicing Forgery Detection using Local Binary Pattern and Discrete Wavelet Transform
    Hakimi, Fahime
    Hariri, Mandi
    GharehBaghi, Farhad
    [J]. 2015 2ND INTERNATIONAL CONFERENCE ON KNOWLEDGE-BASED ENGINEERING AND INNOVATION (KBEI), 2015, : 1074 - 1077
  • [7] Image splicing detection scheme based on error level analysis and local binary pattern
    Zhang, Yi-Jia
    Shi, Tong-Tong
    Lu, Zhe-Ming
    [J]. Journal of Network Intelligence, 2021, 6 (02): : 303 - 312
  • [8] Content-Based Image Retrieval Using Moments of Local Ternary Pattern
    Srivastava, Prashant
    Nguyen Thanh Binh
    Khare, Ashish
    [J]. MOBILE NETWORKS & APPLICATIONS, 2014, 19 (05): : 618 - 625
  • [9] Content-Based Image Retrieval Using Moments of Local Ternary Pattern
    Prashant Srivastava
    Nguyen Thanh Binh
    Ashish Khare
    [J]. Mobile Networks and Applications, 2014, 19 : 618 - 625
  • [10] Image splicing detection using discriminative robust local binary pattern and support vector machine
    Akram, Arslan
    Ramzan, Saba
    Rasool, Akhtar
    Jaffar, Arfan
    Furqan, Usama
    Javed, Wahab
    [J]. WORLD JOURNAL OF ENGINEERING, 2022, 19 (04) : 459 - 466