Material contrast studies of conductive thin films on semiconductor substrates using scanning electrochemical microscopy

被引：0
|
作者：
Patrick Hanekamp
Timo Raith
Christian Iffelsberger
Tobias Zankl
Werner Robl
Frank-Michael Matysik
机构：
[1] University of Regensburg,Institute of Analytical Chemistry, Chemo
[2] Infineon Technologies AG, and Biosensors
来源：
Journal of Applied Electrochemistry | 2019年 / 49卷
关键词：
Scanning electrochemical microscopy; Hydrogen evolution reaction; Thin film metals; Substrate generation-tip collection mode;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
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页码：455 / 463
页数：8
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