QTL for spike-layer uniformity and their influence on yield-related traits in wheat

被引：0
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作者：
Chunhua Zhao
Na Zhang
Yongzhen Wu
Han Sun
Cheng Liu
Xiaoli Fan
Xuemei Yan
Hongxing Xu
Jun Ji
Fa Cui
机构：
[1] Ludong University,College of Agriculture
[2] Chinese Academy of Sciences,Center for Agricultural Resources Research, Institute of Genetics and Developmental Biology
[3] Shandong Academy of Agricultural Sciences,Crop Research Institute
[4] Chinese Academy of Sciences,Chengdu Institute of Biology
[5] Anqiu Municipal Burean of Agriculture,Institute of Plant Stress Biology, State Key Laboratory of Cotton Biology, Department of Biology
[6] Henan University,undefined
来源：
BMC Genetics | / 20卷
关键词：
Quantitative trait locus; Recombinant inbred line; Spike-layer uniformity; Wheat; Yield;
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