Characterization of a high-power tapered semiconductor amplifier system

被引:0
|
作者
D. Voigt
E.C. Schilder
R.J.C. Spreeuw
H.B. van Linden van den Heuvell
机构
[1] Van der Waals–Zeeman Instituut,
[2] Universiteit van Amsterdam,undefined
[3] Valckenierstraat 65,undefined
[4] 1018 XE Amsterdam,undefined
[5] The Netherlands,undefined
来源
Applied Physics B | 2001年 / 72卷
关键词
PACS: 42.55.Px; 42.60.Da; 32.80.Pj;
D O I
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学科分类号
摘要
We have characterized a semiconductor amplifier laser system which provides up to 200 mW output after a single-mode optical fiber at 780 nm wavelength. The system is based on a tapered semiconductor gain element, which amplifies the output of a narrow-linewidth diode laser. Gain and saturation are discussed as a function of operating temperature and injection current. The spectral properties of the amplifier are investigated with a grating spectrometer. Amplified spontaneous emission (ASE) causes a spectral background with a width of 4 nm FWHM. The ASE background was suppressed to below our detection limit by a proper choice of operating current and temperature and by sending the light through a single-mode optical fiber. The final ASE spectral density was less than 0.1 nW/MHz, i.e. less than 0.2% of the optical power. Related to an optical transition linewidth of Γ/2π=6 MHz for rubidium, this gives a background suppression of better than -82 dB. An indication of the beam quality is provided by the fiber coupling efficiency of up to 59%. The application of the amplifier system as a laser source for atom-optical experiments is discussed.
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页码:279 / 284
页数:5
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