共 50 条
- [2] ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY WITH A COMBINATION ATOMIC FORCE MICROSCOPE SCANNING TUNNELING MICROSCOPE JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (03): : 2089 - 2092
- [3] Atomic force microscope combined with scanning tunneling microscope [AFM/STM] Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1993, 32 (6 B): : 2983 - 2988
- [4] ATOMIC-FORCE MICROSCOPE COMBINED WITH SCANNING TUNNELING MICROSCOPE [AFM/STM] JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1993, 32 (6B): : 2983 - 2988
- [5] CURRENT CHARACTERISTICS FOR THE SCANNING TUNNELING MICROSCOPE JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (03): : 2175 - 2178
- [7] COMPACT, COMBINED SCANNING TUNNELING FORCE MICROSCOPE REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (05): : 3003 - 3006
- [9] The effects of two-dimensional bifurcations and quantum beats in a system of combined atomic force and scanning tunneling microscopes with quantum dots Moscow University Physics Bulletin, 2016, 71 : 545 - 555
- [10] CURRENT VOLTAGE CHARACTERISTICS OF SILICON MEASURED WITH THE SCANNING TUNNELING MICROSCOPE IN AIR JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (04): : 2741 - 2744