3D elemental sensitive imaging using transmission X-ray microscopy

被引:0
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作者
Yijin Liu
Florian Meirer
Junyue Wang
Guillermo Requena
Phillip Williams
Johanna Nelson
Apurva Mehta
Joy C. Andrews
Piero Pianetta
机构
[1] Stanford Synchrotron Radiation Lightsource,Institute of Materials Science and Technology
[2] SLAC National Accelerator Laboratory,undefined
[3] Fondazione Bruno Kessler,undefined
[4] Advanced Photon Source,undefined
[5] Argonne National Laboratory,undefined
[6] Vienna University of Technology,undefined
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关键词
Transmission X-ray microscopy; Synchrotron radiation; 3D elemental mapping;
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摘要
Determination of the heterogeneous distribution of metals in alloy/battery/catalyst and biological materials is critical to fully characterize and/or evaluate the functionality of the materials. Using synchrotron-based transmission x-ray microscopy (TXM), it is now feasible to perform nanoscale-resolution imaging over a wide X-ray energy range covering the absorption edges of many elements; combining elemental sensitive imaging with determination of sample morphology. We present an efficient and reliable methodology to perform 3D elemental sensitive imaging with excellent sample penetration (tens of microns) using hard X-ray TXM. A sample of an Al–Si piston alloy is used to demonstrate the capability of the proposed method.
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页码:1297 / 1301
页数:4
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