Thin-film image sensors with a pinned photodiode structure

Image sensors made using silicon complementary metal–oxide–semiconductor technology can be found in numerous electronic devices and typically rely on pinned photodiode structures. Photodiodes based on thin films can have a high absorption coefficient and a wider wavelength range than silicon devices. However, their use in image sensors has been limited by high kTC noise, dark current and image lag. Here we show that thin-film-based image sensors with a pinned photodiode structure can have comparable noise performance to a silicon pinned photodiode pixel. We integrate either a visible-to-near-infrared organic photodiode or a short-wave infrared colloidal quantum dot photodiode with a thin-film transistor and silicon readout circuitry. The thin-film pinned photodiode structures exhibit low kTC noise, suppressed dark current, high full-well capacity and high electron-to-voltage conversion gain, as well as preserving the benefits of the thin-film materials. An image sensor based on the organic absorber has a quantum efficiency of 54% at 940 nm and read noise of 6.1e–.