Nanoscale electrical characterization of graphene-based materials by atomic force microscopy

被引：0
|
作者：
K. Kanishka H. De Silva
Hsin-Hui Huang
Pamarti Viswanath
Rakesh Joshi
Masamichi Yoshimura
机构：
[1] Toyota Technological Institute,Graduate School of Engineering
[2] Japan Fine Ceramics Center,School of Materials Science and Engineering
[3] University of New South Wales,undefined
来源：
Journal of Materials Research | 2022年 / 37卷
关键词：
Atomic force microscopy; Graphene; Graphene oxide; Nanoscale characterization; Electrical properties;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：3319 / 3339
页数：20
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