Mapping inventive activity and technological change through patent analysis: A case study of India and China

被引:0
|
作者
Sujit Bhattacharya
机构
[1] NISTADS National Institute of Science,
[2] Technology and Development Studies,undefined
来源
Scientometrics | 2004年 / 61卷
关键词
Patent Statistic; Patent Activity; Patent System; Patent Data; Chinese Patent;
D O I
暂无
中图分类号
学科分类号
摘要
The characteristics of Indian and Chinese patenting activity in the US patent system are examined by delineating two categories of patents; ‘nationally assigned’, and ‘invented not nationally assigned’ patents (not-nationally assigned patents in short). Further within the above two categories, patents are distinguished and analysed in terms of patent types: utility, design, and plant patents. Indian patents are mainly of utility type whereas China's activity falls in both utility and design.In the ‘nationally assigned’ patents, the different types of institutions involved and linkages are much higher for China. However, ‘not-nationally assigned’ patents of both the countries are dominated by industry and inter-institutional collaborations are sparse. Patents addressing technology sectors (analysis based on utility patents) do not exhibit major differences between the two categories in Chinese patents and address with varying degree all technology sectors. Unlike China, India's ‘nationally assigned’ patents are concentrated in chemical and drugs & medical whereas their ‘not-nationally assigned’ patents are similar to that of China in addressing technology sectors. In design patents, Chinese ‘nationally assigned’ patents mainly cover ornamental design of lighting equipments whereas their ‘not-nationally assigned’ patents are mainly in design equipment for production, distribution or transformation of energy. Further, few firms are active in design patents in both the categories. India's design activity is insignificant in both the categories. The paper concludes by examining the results in the policy context.
引用
收藏
页码:361 / 381
页数:20
相关论文
共 50 条
  • [1] Mapping inventive activity and technological change through patent analysis: A case study of India and China
    Bhattacharya, S
    [J]. SCIENTOMETRICS, 2004, 61 (03) : 361 - 381
  • [2] Mapping technological innovations through patent analysis: a case study of foreign multinationals and indigenous firms in China
    Wong, Chan-Yuan
    Yap, Xiao-Shan
    [J]. SCIENTOMETRICS, 2012, 91 (03) : 773 - 787
  • [3] Mapping technological innovations through patent analysis: a case study of foreign multinationals and indigenous firms in China
    Chan-Yuan Wong
    Xiao-Shan Yap
    [J]. Scientometrics, 2012, 91 : 773 - 787
  • [4] Measuring patent's influence on technological evolution: A study of knowledge spanning and subsequent inventive activity
    Corredoira, Rafael A.
    Banerjee, Preeta M.
    [J]. RESEARCH POLICY, 2015, 44 (02) : 508 - 521
  • [5] International landscape of the inventive activity on climate change mitigation technologies. A patent analysis
    Pasimeni, Francesco
    Fiorini, Alessandro
    Georgakaki, Aliki
    [J]. ENERGY STRATEGY REVIEWS, 2021, 36
  • [6] Examining technological collaboration through patent analysis: Case study of some emerging economies
    Bhattacharya, I
    Sharma, SC
    [J]. ISSI 2005: Proceedings of the 10th International Conference of the International Society for Scientometrics and Informetrics, Vols 1 and 2, 2005, : 731 - 732
  • [7] Exploring pathways of regional technological development in China through patent analysis
    Kroll, Henning
    [J]. WORLD PATENT INFORMATION, 2016, 46 : 74 - 86
  • [8] Mapping the technological impact of chitosan research through patent citations
    Mhamdi, R.
    [J]. MATERIALS TODAY COMMUNICATIONS, 2024, 41
  • [9] Patent Network Analysis for Identifying Technological Evolution: A Case Study of China's Artificial Intelligence Technologies
    Huang, Lu
    Miao, Wen
    Zhang, Yi
    Yu, Huizhu
    Wang, Kangrui
    [J]. 2017 PORTLAND INTERNATIONAL CONFERENCE ON MANAGEMENT OF ENGINEERING AND TECHNOLOGY (PICMET), 2017,
  • [10] Mapping Technological Trajectory as Patent Analysis and Delphi Investigation
    Lee, P. C.
    Su, H. N.
    [J]. 2008 IEEE INTERNATIONAL CONFERENCE ON MANAGEMENT OF INNOVATION AND TECHNOLOGY, VOLS 1-3, 2008, : 23 - 28