Microstructure and properties of low-voltage ZnO varistor ceramics

被引：0
|
作者：
Congchun Zhang
Dongxiang Zhou
Wenzhong Lu
Yunxiang Hu
机构：
[1] Huazhong University of Science and Technology,Department of Solid State Electronics
来源：
Journal of Materials Science: Materials in Electronics | 2001年 / 12卷
关键词：
Microstructure; Electrical Property; Electronic Material; Great Influence; Sinter Temperature;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The influences of pre-firing process and sintering temperature on the microstructure and electrical properties of ZnO-Bi2O3-TiO2-Sb2O3-MnO2-CoO low-voltage varistor ceramics were studied. Especially, twin boundaries and exaggerated grain growth (EGG) were observed here, and the mechanism of EGG was discussed. It seems that the formation of twin boundaries has a correlation with Sb2O3 content and sintering temperature, and that twin boundaries have a great influence in grain growth of ZnO.
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页码：357 / 360
页数：3
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