Calculation of correlations in the surface structure of solids

被引：0
|
作者：
S. M. Mursalov
N. V. Bodyagin
S. P. Vikhrov
机构：
[1] Ryazan State Radioengineering Academy,
来源：
Technical Physics Letters | 2000年 / 26卷
关键词：
Silicon; Experimental Investigation; Surface Structure; Reciprocal Information;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Methods for the calculation of correlations in the surface structure of solids are analyzed. A new approach is proposed based on determination of the mean reciprocal information for two-dimensional systems. The approach is applied to interpretation of the results of experimental investigation of the surface of amorphized hydrogenated silicon.
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页码：668 / 670
页数：2
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