Reply to the “Discussion of the Paper by Krick et al.: Optical In Situ Micro Tribometer for Analysis of Real Contact Area for Contact Mechanics, Adhesion, and Sliding Experiments”

被引:0
|
作者
B. A. Krick
J. R. Vail
B. N. J. Persson
W. G. Sawyer
机构
[1] University of Florida,Department of Mechanical and Aerospace Engineering
[2] IFF,undefined
[3] FZ-Jülich,undefined
来源
Tribology Letters | 2012年 / 46卷
关键词
Interference Pattern; Real Contact Area; Order Fringe; Real Area; Spherical Contact;
D O I
暂无
中图分类号
学科分类号
摘要
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页码:207 / 209
页数:2
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