Detection of Negative Thermal Expansion in a Single Crystal of Sr0.75Ba0.25Nb6O2 Relaxor Ferroelectric by X-Ray Diffraction Analysis

被引：0
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作者：
A. P. Dudka
机构：
[1] Federal Research Center “Crystallography and Photonics”,
[2] Shubnikov Institute of Crystallography,undefined
[3] Russian Academy of Sciences,undefined
来源：
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques | 2020年 / 14卷
关键词：
relaxor ferroelectric; relaxor; X-ray diffraction analysis; multitemperature diffraction study; negative thermal expansion; Burns temperature; electrical resistance; enantiomorphic configurations;
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摘要：
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页码：574 / 577
页数：3
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