Temporal characteristic analysis of single event effects in pulse width modulator

被引：0
|
作者：
Wen Zhao
Xiao-Qiang Guo
Wei Chen
Zu-Jun Wang
Hong-Xia Guo
Yuan-Ming Wang
机构：
[1] Xi’an Jiaotong University,School of Nuclear Science and Technology
[2] Northwest Institute of Nuclear Technology,State Key Laboratory of Intense Pulsed Radiation Simulation and Effect
来源：
Nuclear Science and Techniques | 2017年 / 28卷
关键词：
Single event effect (SEE); Laser testing; Pulse width modulator;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
In this paper, the nature and origin of single event effects (SEE) are studied by injecting laser pulses into different circuit blocks, combining with analysis to map pulse width modulators circuitry in the microchip die. A time-domain error-identification method is used in the temporal characteristic analysis of SEE. SEE signatures of different injection times are compared. More serious SEE are observed when the laser shot occurs on a rising edge of the device output for blocks of the error amplifier, current sense comparator, and T and SR latches.
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