Perturbation-Based Fourier Series Analysis of Transistor Amplifier

被引:0
|
作者
Akash Rathee
Harish Parthasarathy
机构
[1] Netaji Subhas Institute of Technology,Department of Electronics and Communication Engineering
关键词
Perturbation technique; Multi-variable state equations; Fourier series; Ebers–Moll; Weakly nonlinear circuits;
D O I
暂无
中图分类号
学科分类号
摘要
A perturbation-based Fourier series model is proposed to approximate the nonlinear distortion in weakly nonlinear circuits. This general model is applicable to any set of multi-variable state equations that completely describe a nonlinear circuit. This model is applied to a common emitter amplifier circuit wherein the transistor is represented by Ebers–Moll nonlinear current equations. Appropriate state variables are defined, then the linear and nonlinear parts of the Ebers–Moll current equations are separated, and a small perturbation parameter is incorporated into the nonlinear part. Now these current equations are incorporated into the set of KCL, KVL equations defined for the circuit and the state variables are perturbatively expanded. Hence, multi-variable state equations are obtained from these equations. The state variables are approximated up to first order through Fourier series expansion, as described in the proposed model. The main advantage of the proposed model is that it is simple and straightforward approach to analyze weakly nonlinear circuits, as it involves matrix computations and the calculations of exponential Fourier coefficients.
引用
收藏
页码:313 / 328
页数:15
相关论文
共 50 条
  • [1] Perturbation-Based Fourier Series Analysis of Transistor Amplifier
    Rathee, Akash
    Parthasarathy, Harish
    [J]. CIRCUITS SYSTEMS AND SIGNAL PROCESSING, 2012, 31 (01) : 313 - 328
  • [2] Perturbation-based classifier
    Edson L. Araújo
    George D. C. Cavalcanti
    Tsang Ing Ren
    [J]. Soft Computing, 2020, 24 : 16565 - 16576
  • [3] Perturbation-based classifier
    Araujo, Edson L.
    Cavalcanti, George D. C.
    Ren, Tsang Ing
    [J]. SOFT COMPUTING, 2020, 24 (21) : 16565 - 16576
  • [4] A perturbation-based testing strategy
    Murrill, B
    Morell, L
    Olimpiew, E
    [J]. EIGHTH IEEE INTERNATIONAL CONFERENCE ON ENGINEERING OF COMPLEX COMPUTER SYSTEMS, PROCEEDINGS, 2002, : 145 - 152
  • [5] Perturbation-based fault screening
    Racunas, Paul
    Constantinides, Kypros
    Manne, Srilatha
    Mukherjee, Shubhendu S.
    [J]. THIRTEENTH INTERNATIONAL SYMPOSIUM ON HIGH-PERFORMANCE COMPUTER ARCHITECTURE, PROCEEDINGS, 2007, : 169 - +
  • [6] Perturbation-based nonperturbative method
    Liu, Chang
    Li, Wen-Du
    Dai, Wu-Sheng
    [J]. ANNALS OF PHYSICS, 2024, 468
  • [7] Homotopy Perturbation-Based Dynamic Analysis of Structural Systems
    Meshki, Hossein
    Rezaei, Ahad
    Sadeghi, Amir
    [J]. JOURNAL OF ENGINEERING MECHANICS, 2020, 146 (12)
  • [8] Acceleration of Perturbation-Based Electric Field Integral Equations Using Fast Fourier Transform
    Jia, Miao Miao
    Sun, Sheng
    Li, Yin
    Qian, Zhi-Guo
    Chew, Weng Cho
    [J]. IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, 2016, 64 (10) : 4559 - 4564
  • [9] Singular Perturbation-based Variable Impedance Control of Robots with Series Elastic Actuators
    Deng, Dongning
    Sun, Tairen
    Guo, Zhao
    Pan, Yongping
    [J]. PROCEEDINGS OF THE 38TH CHINESE CONTROL CONFERENCE (CCC), 2019, : 4397 - 4402
  • [10] Perturbation-Based Stochastic Meshless Method for Buckling Analysis of Plates
    Aswathy, M.
    Arun, C. O.
    [J]. INTERNATIONAL JOURNAL OF COMPUTATIONAL METHODS, 2021, 18 (10)