Pixel-based characterisation of CMOS high-speed camera systems

被引:0
|
作者
V. Weber
J. Brübach
R. L. Gordon
A. Dreizler
机构
[1] Technische Universität Darmstadt,Fachgebiet Reaktive Strömungen und Messtechnik, Center of Smart Interfaces
[2] University of Cambridge,Hopkinson Laboratory, Department of Engineering
来源
Applied Physics B | 2011年 / 103卷
关键词
Particle Image Velocime; High Repetition Rate; Planar Laser Induce Fluorescence; CMOS Camera; Tomographic Particle Image Velocime;
D O I
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中图分类号
学科分类号
摘要
Quantifying high-repetition rate laser diagnostic techniques for measuring scalars in turbulent combustion relies on a complete description of the relationship between detected photons and the signal produced by the detector. CMOS-chip based cameras are becoming an accepted tool for capturing high frame rate cinematographic sequences for laser-based techniques such as Particle Image Velocimetry (PIV) and Planar Laser Induced Fluorescence (PLIF) and can be used with thermographic phosphors to determine surface temperatures. At low repetition rates, imaging techniques have benefitted from significant developments in the quality of CCD-based camera systems, particularly with the uniformity of pixel response and minimal non-linearities in the photon-to-signal conversion. The state of the art in CMOS technology displays a significant number of technical aspects that must be accounted for before these detectors can be used for quantitative diagnostics. This paper addresses these issues.
引用
收藏
页码:421 / 433
页数:12
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