Electron impact ionization of helium isoelectronic systems

被引：0
|
作者：
M. R. Talukder
机构：
[1] Department of Applied Physics & Electronic Engineering University of Rajshahi,
来源：
The European Physical Journal D | 2008年 / 49卷
关键词：
34.80.Dp Atomic excitation and ionization by electron impact;
D O I：
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中图分类号：
学科分类号：
摘要：
The electron impact single ionization cross sections, on the helium isoelectronic He, Li1+, B3+, C4+, N5+, O6+, Ne8+, Na9+, Ar+16, Fe24+, Mo41+, Ag45+, and U90+ targets, are calculated modifying the simplified Bell (SBELL) model [Eur. Phys. J. D 46, 281 (2008)]. The results of the present analysis are compared with the available experimental and theoretical data. The modified SBELL (MSBELL) model, incorporating the ionic correction factor in it, produces excellent agreement with the experimental data and theoretical calculations for all the two-electron systems, neutral or ions. This model may be a prudent choice in plasma modeling due to its simple inherent structure.
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页码：167 / 172
页数：5
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