A focusing method on refraction topography measurement

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作者
Huang Yequan
Guo Jingyun
Guo Yu
Cui Yan
Li Zhechuang
Dong Xuechuan
Ning Xiaolin
机构
[1] Beihang University,School of Instrumentation Science and Opto
[2] Shenzhen Thondar Technology Co. Ltd,Electronics Engineering
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摘要
This paper introduces a novel focusing method Refraction Topography (RT) for wide-angle refraction measurement. The agreement of the test results obtained using RT is evaluated against simulation results and expected refraction. RT develops a refraction algorithm on fundus images at various focusing statuses. Unlike conventional techniques for peripheral refraction measurement, RT requires the subject to stare at a stationary fixation target. The refraction algorithm calculates the focus measure for multiple images at the Point of Interest and formulates them into a focus profile. The maximum focus measure correlates with the optimal focus position. Refraction Characterization Function (RCF) is proposed to translate the focus position into refraction determination, thus forming the refraction topography. The refraction characterization of RT optical system is performed using Isabel schematic eye. Three test eyes of − 15 D, 0 D, and + 15 D are defined, and expected refraction is obtained through simulation on an independent test schematic eye. Both simulation results and experimental results are obtained by combining the test eyes and RT system. Test results are compared with simulation results and expected refraction. The study demonstrates agreement among the test results, simulation results, and expected refraction on three test eyes.
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