Effect of dispersion on metal-insulator-metal infrared absorption resonances

被引：0
|
作者：
Seth R. Calhoun
Vanessa C. Lowry
Reid Stack
Rachel N. Evans
Jonathan R. Brescia
Chris J. Fredricksen
Janardan Nath
Robert E. Peale
Evan M. Smith
Justin W. Cleary
机构：
[1] University of Central Florida,Physics Department
[2] KBRWyle,undefined
[3] Air Force Research Laboratory,undefined
[4] Sensors Directorate,undefined
[5] Wright-Patterson AFB,undefined
来源：
MRS Communications | 2018年 / 8卷
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摘要：
Metal-insulator-metal (MIM) resonant absorbers comprise a conducting ground plane, a thin dielectric, and thin separated metal top-surface structures. The dielectric SiO2 strongly absorbs near 9 μm wavelength and has correspondingly strong long-wave-infrared (LWIR) dispersion for the refractive index. This dispersion results in multiple absorption resonances spanning the LWIR, which can enhance broad-band sensitivity for LWIR bolometers. Similar considerations apply to silicon nitride Si3N4. TiO2 and AlN have comparatively low dispersion and give simple single LWIR resonances. These dispersion-dependent features for infrared MIM devices are demonstrated by experiment, electrodynamic simulation, and an analytic model based on standing waves.
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页码：830 / 834
页数：4
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