Surface Layer Investigation of a Shot-Peened Duplex Stainless Steel Utilizing X-ray Diffraction

被引:0
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作者
Qiang Feng
Xueyan Wu
Chuanhai Jiang
Zhou Xu
Lihong Wu
机构
[1] Shanghai Jiao Tong University,School of Materials Science and Engineering
关键词
duplex stainless steel; Hertzian pressure; microhardness; microstructure; residual stress; shot peening; x-ray diffraction;
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摘要
Distributions of residual stresses and microstructure in the surface layers of shot-peened duplex stainless steel (DSS) S32205 were investigated. The results reveal that both compressive residual stresses (CRS) and microhardness increase with the enhancement of shot-peening (SP) intensity in the surface deformation layers. The maximum value of CRS of ferrite lies in the surface layer but that of austenite locates below the surface layer after SP. SP influence on the microstructure of DSS was studied using x-ray diffraction profiles, and the domain size and microstrain were calculated via Voigt method. After SP, the domain sizes are refined, and microstrain becomes severe at surface layers in both phases. On comparing the calculated results, it is found that the more evident domain size subdivision and the more serious microstrain increase in austenite than those in ferrite are due to the higher work hardening of austenite.
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页码:2005 / 2011
页数:6
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