Electrical characterizations of Neutron-irradiated SiC Schottky diodes

被引:0
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作者
Geunwoo Ko
Hong-Yeol Kim
Joona Bang
Jihyun Kim
机构
[1] Korea University,Department of Chemical and Biological Engineering
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关键词
Neutron Irradiation; Silicon Carbide; Diode;
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摘要
Neutrons with an average energy of 9.8±0.8 MeV were irradiated onto silicon carbide Schottky diodes. After bombardment at a fluency of 2.75×1011 neutron/cm2, the Schottky barrier height, ideality factor, and the leakage currents remained unchanged. The electrical properties began to deteriorate after bombardment at a fluency of 5.5×1011 neutron/cm2. In this study, we demonstrate that SiC SBD is robust under neutron irradiations and is well suited for space operations up to bombardments at a fluency of 2.75×1011 neutron/cm2.
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页码:285 / 287
页数:2
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