Environmental Trace-Element Analysis Using a Benchtop Total Reflection X-Ray Fluorescence Spectrometer

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作者：
Hagen Stosnach
机构：
[1] Röntec AG,
来源：
Analytical Sciences | 2005年 / 21卷
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摘要：
Total reflection X-ray fluorescence (TXRF) analysis is an established technique for trace-element analysis in various types of samples. Though expensive large-scale systems restricted the applications in the past, in this study the capability of a benchtop system for trace elemental analysis is reported. The suitability of this system for the mobile on-site analysis of heavy metal contaminated soils and sediments is reported as well as the possibilities and restrictions of TXRF for additional applications, including trace-element analysis of water, glass and biological samples.
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页码：873 / 876
页数：3
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