Unifying measurements in testing measuring instruments

被引：0

作者：

S. F. Levin

机构：

[1] Moscow Institute for Expert Evaluation and Testing,

来源：

Measurement Techniques | 2008年 / 51卷

关键词：

unified measurements; error probability distribution; structural and parametric identification;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Structural and parametric identification are considered for the error probability distribution for a particular type of measuring instrument.

引用

页码：1065 / 1070

页数：5

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[1] Unifying measurements in testing measuring instruments
Levin, S. F.
[J]. MEASUREMENT TECHNIQUES, 2008, 51 (10) : 1065 - 1070
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