Coupling atomistic and continuous media models for electronic device simulation

被引:0
|
作者
Matthias Auf der Maur
Alessandro Pecchia
Gabriele Penazzi
Fabio Sacconi
Aldo Di Carlo
机构
[1] University of Rome “Tor Vergata”,Dept. of Electronic Engineering
[2] CNR-ISMN,BCCMS
[3] University Bremen,undefined
[4] Tiberlab Srl.,undefined
来源
关键词
Device simulation; Multiscale modeling; Atomistic models;
D O I
暂无
中图分类号
学科分类号
摘要
In this article we highlight the necessity of atomistic based, fully quantum mechanical simulation approaches for modern electronic devices and their coupling with classical models. We review different ways of such couplings and provide application examples.
引用
收藏
页码:553 / 562
页数:9
相关论文
共 50 条
  • [1] Coupling atomistic and continuous media models for electronic device simulation
    Maur, Matthias Auf Der
    Pecchia, Alessandro
    Penazzi, Gabriele
    Sacconi, Fabio
    Di Carlo, Aldo
    [J]. JOURNAL OF COMPUTATIONAL ELECTRONICS, 2013, 12 (04) : 553 - 562
  • [2] BUILDING HIGHLY TRANSFERABLE INTERATOMIC MODELS FOR ATOMISTIC SIMULATION OF DEVICE RELIABILITY
    Umeno, Yoshitaka
    Kubo, Atsushi
    [J]. NANO, BIO AND GREEN - TECHNOLOGIES FOR A SUSTAINABLE FUTURE CONFERENCE PROCEEDINGS, SGEM 2016, VOL III, 2016, : 19 - 26
  • [4] Connecting Atomistic and Continuous Models of Elastodynamics
    Julian Braun
    [J]. Archive for Rational Mechanics and Analysis, 2017, 224 : 907 - 953
  • [5] Bridging methods for coupling atomistic and continuum models
    Badia, Santiago
    Bochev, Pavel
    Gunzburger, Max
    Lehoucq, Richard
    Parks, Michael
    [J]. LARGE-SCALE SCIENTIFIC COMPUTING, 2008, 4818 : 16 - +
  • [6] Integrated atomistic process and device simulation of decananometre MOSFETs
    Asenov, A
    Jaraiz, M
    Roy, S
    Roy, G
    Adamu-Lema, F
    Brown, AR
    Moroz, V
    Gafiteanu, R
    [J]. SISPAD 2002: INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES, 2002, : 87 - 90
  • [7] Nano-device Simulation from an Atomistic View
    Mori, N.
    Mil'nikov, G.
    Minari, H.
    Kamakura, Y.
    Zushi, T.
    Watanabe, T.
    Uematsu, M.
    Itoh, K. M.
    Uno, S.
    Tsuchiya, H.
    [J]. 2013 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2013,
  • [8] Coupling of length scales and atomistic simulation of MEMS resonators
    Rudd, RE
    Broughton, JQ
    [J]. DESIGN, TEST, AND MICROFABRICATION OF MEMS AND MOEMS, PTS 1 AND 2, 1999, 3680 : 104 - 113
  • [9] Device-size atomistic models of amorphous silicon
    Vink, RLC
    Barkema, GT
    Stijnman, MA
    Bisseling, RH
    [J]. PHYSICAL REVIEW B, 2001, 64 (24) : 2452141 - 2452146
  • [10] Coupling density phase field models with atomistic potentials
    Jacobson, David
    Kamachali, Reza Darvishi
    Thompson, Gregor y B.
    [J]. COMPUTATIONAL MATERIALS SCIENCE, 2024, 233