Synthesis, characterization and electrical properties of novel Mn substituted MgAl2O4 synthesized by sol–gel method

Nanostructured manganese doped magnesium aluminate (Mg1−xMnxAl2O4, where x = 0.0, 0.25, 0.50, 0.75, 1.0) were prepared by a sol–gel method. All the samples were characterised by TGA, XRD, SEM, EDAX, TEM and IR spectroscopy techniques. The semiconducting nature of materials were investigated by DC resistivity measurement. The TGA curves show that spinel the oxides are formed at 600 °C. The XRD studies reveal formation of cubic spinel phase with average crystallite size of 28 nm. The composition of Mg1−xMnxAl2O4, (x = 0.0, 0.50, 1.0) shows spherical interlinked fibrous morphology. The elemental compositions determined by energy dispersive X-ray analysis (EDAX) indicate desired composition. Particle size obtained from TEM analysis was found to be ~23 nm. The IR spectra show two strong characteristic absorption bands at tetrahedral and octahedral sites. The temperature dependent variation of dc resistivity of material reflects semiconducting nature of materials.