A synthetic control chart for monitoring process dispersion with sample range

被引：0
|
作者：
F.-L. Chen
H.-J. Huang
机构：
[1] National Tsing Hua University,Department of Industrial Engineering and Engineering Management
来源：
The International Journal of Advanced Manufacturing Technology | 2005年 / 26卷
关键词：
Control chart; Conforming run length; Process dispersion; Variable sampling interval;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A synthetic control chart for monitoring the changes in the standard deviation of a normally distributed process is proposed in this paper. The synthetic chart consists of the sample range (R) chart and the conforming run-length (CRL) chart. The R chart can be viewed as a special case of the synthetic chart. The operation, design and performance of this chart are described. Average run- length comparisons between other procedures and the synthetic chart are presented. It indicates that the synthetic chart is a good alternative for monitoring process dispersion. The variable sampling interval (VSI) schemes, as an enhancement to the synthetic chart, are discussed to further improve the chart performance. An example is presented to illustrate the application of synthetic chart and its VSI scheme.
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页码：842 / 851
页数：9
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