Approximation of the solution of inverse problem of scattering of electromagnetic waves on plane dielectrics

We propose a method for the determination of the material parameters of dielectric coatings according to the measured values of scattered electromagnetic fields which enables us to introduce an efficient procedure of processing of the data of measurements in the methods of nondestructive testing. As a specific feature of the proposed method for the solution of the formulated inverse problem, we can mention the possibility of reconstruction of piecewise continuous profiles of dielectric permittivity for laminated materials. The procedure of reconstruction is based on the method of integral equations. The solution of the problem is obtained approximately. The measured values of the coefficient of reflection of plane electromagnetic waves are extrapolated to the high-frequency region, which enables us to guarantee higher accuracy of reconstruction of the functions of dielectric permittivity for the analyzed structures.