Comparison of the dark signal degradation induced by Gamma ray, proton, and neutron radiation in pinned photodiode CMOS image sensors

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作者：
Zujun Wang
Yuanyuan Xue
Wei Chen
Rui Xu
Hao Ning
Baoping He
Zhibin Yao
Minbo Liu
Jiangkun Sheng
Wuying Ma
Guantao Dong
机构：
[1] Northwest Institute of Nuclear Technology,State Key Laboratory of Intense Pulsed Irradiation Simulation and Effect
[2] Xiangtan University,School of Materials Science and Engineering
来源：
Science China Information Sciences | 2019年 / 62卷
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