Synthesis of large-area multilayer hexagonal boron nitride for high material performance

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作者
Soo Min Kim
Allen Hsu
Min Ho Park
Sang Hoon Chae
Seok Joon Yun
Joo Song Lee
Dae-Hyun Cho
Wenjing Fang
Changgu Lee
Tomás Palacios
Mildred Dresselhaus
Ki Kang Kim
Young Hee Lee
Jing Kong
机构
[1] Institute of Advanced Composite Materials,Department of Electrical Engineering and Computer Sciences
[2] Korea Institute of Science and Technology (KIST),Department of Energy Science, Department of Physics
[3] Massachusetts Institute of Technology,Department of Mechanical and Aerospace Engineering
[4] School of Advanced Materials Science and Engineering,Department of Physics
[5] Sungkyunkwan University,Department of Energy and Materials Engineering
[6] Center for Integrated Nanostructure Physics (CINAP),undefined
[7] Institute for Basic Science (IBS),undefined
[8] Sungkyunkwan University,undefined
[9] Sungkyunkwan University,undefined
[10] The Ohio State University,undefined
[11] School of Mechanical Engineering,undefined
[12] Sungkyunkwan University,undefined
[13] SKKU Advanced Institute of Nanotechnology,undefined
[14] Sungkyunkwan University,undefined
[15] Massachusetts Institute of Technology,undefined
[16] Dongguk University-Seoul,undefined
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摘要
Although hexagonal boron nitride (h-BN) is a good candidate for gate-insulating materials by minimizing interaction from substrate, further applications to electronic devices with available two-dimensional semiconductors continue to be limited by flake size. While monolayer h-BN has been synthesized on Pt and Cu foil using chemical vapour deposition (CVD), multilayer h-BN is still absent. Here we use Fe foil and synthesize large-area multilayer h-BN film by CVD with a borazine precursor. These films reveal strong cathodoluminescence and high mechanical strength (Young’s modulus: 1.16±0.1 TPa), reminiscent of formation of high-quality h-BN. The CVD-grown graphene on multilayer h-BN film yields a high carrier mobility of ∼24,000 cm2 V−1 s−1 at room temperature, higher than that (∼13,000 2 V−1 s−1) with exfoliated h-BN. By placing additional h-BN on a SiO2/Si substrate for a MoS2 (WSe2) field-effect transistor, the doping effect from gate oxide is minimized and furthermore the mobility is improved by four (150) times.
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