X-ray fluorescence analysis of the composition of As-Ge-Se glasses and films

被引:0
|
作者
G. A. Bordovskii
P. V. Gladkikh
I. V. Eremin
A. V. Marchenko
P. P. Seregin
N. N. Smirnova
E. I. Terukov
机构
[1] Russian State Pedagogical University,Ioffe Physical Technical Institute
[2] Russian Academy of Sciences,undefined
来源
Technical Physics Letters | 2011年 / 37卷
关键词
Arsenic; Selenium; Technical Physic Letter; Anode Voltage; Glassy Alloy;
D O I
暂无
中图分类号
学科分类号
摘要
The external standard technique is developed for the quantitative determination of the content of arsenic, germanium, and selenium in Asx(GeySe1 − y)1 − x glassy alloys by the X-ray fluorescence spectroscopy method. It is demonstrated that the proposed approach allows the glass compositions to be quantitatively determined with an accuracy of ±0.0002 for both x and y.
引用
收藏
页码:250 / 252
页数:2
相关论文
共 50 条
  • [1] X-ray fluorescence analysis of the composition of As-Ge-Se glasses and films
    Bordovskii, G. A.
    Gladkikh, P. V.
    Eremin, I. V.
    Marchenko, A. V.
    Seregin, P. P.
    Smirnova, N. N.
    Terukov, E. I.
    [J]. TECHNICAL PHYSICS LETTERS, 2011, 37 (03) : 250 - 252
  • [2] Determination of the quantitative composition of As-Se and Ge-Se glasses and films by X-ray fluorescence analysis
    Bordovskii, V. A.
    Marchenko, A. V.
    Nasredinov, F. S.
    Kozhokar', M. Yu.
    Seregin, P. P.
    [J]. GLASS PHYSICS AND CHEMISTRY, 2010, 36 (04) : 406 - 410
  • [3] Determination of the quantitative composition of As-Se and Ge-Se glasses and films by X-ray fluorescence analysis
    V. A. Bordovskii
    A. V. Marchenko
    F. S. Nasredinov
    M. Yu. Kozhokar’
    P. P. Seregin
    [J]. Glass Physics and Chemistry, 2010, 36 : 406 - 410
  • [4] Quantitative X-ray fluorescence analysis of As-Se glasses and films
    G. A. Bordovskiĭ
    A. V. Marchenko
    P. P. Seregin
    N. N. Smirnova
    E. I. Terukov
    [J]. Technical Physics Letters, 2009, 35 : 1032 - 1035
  • [5] Quantitative X-ray fluorescence analysis of As-Se glasses and films
    Bordovskii, G. A.
    Marchenko, A. V.
    Seregin, P. P.
    Smirnova, N. N.
    Terukov, E. I.
    [J]. TECHNICAL PHYSICS LETTERS, 2009, 35 (11) : 1032 - 1035
  • [6] X-Ray fluorescence analysis of Ge–As–Se glasses using X-Ray and electron-beam excitation
    G. A. Bordovsky
    A. V. Marchenko
    P. P. Seregin
    K. U. Bobokhuzhaev
    [J]. Inorganic Materials, 2015, 51 : 939 - 943
  • [7] X-Ray fluorescence analysis of Ge-As-Se glasses using X-Ray and electron-beam excitation
    Bordovsky, G. A.
    Marchenko, A. V.
    Seregin, P. P.
    Bobokhuzhaev, K. U.
    [J]. INORGANIC MATERIALS, 2015, 51 (09) : 939 - 943
  • [8] THE X-RAY K ABSORPTION EDGES OF GE AND SE IN GE22SE78-XBIX GLASSES AND AMORPHOUS FILMS
    AGNIHOTRI, AK
    KUMAR, A
    NIGAM, AN
    [J]. PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1988, 57 (02): : 319 - 324
  • [9] ACOUSTOOPTIC PROPERTIES OF GLASSES OF SYSTEMS AS-GE-SE AND AS-GE-SE-SB
    ADRIANOVA, II
    AIO, LG
    ASNIS, LN
    KISLITSKAYA, EA
    KOKORINA, VF
    [J]. SOVIET PHYSICS ACOUSTICS-USSR, 1976, 22 (03): : 250 - 251
  • [10] Determination of the composition of binary chalcogenide glasses by X-ray fluorescence analysis
    Bordovsky, G. A.
    Marchenko, A. V.
    Seregin, P. P.
    Smirnova, N. N.
    Terukov, E. I.
    [J]. SEMICONDUCTORS, 2010, 44 (01) : 24 - 27