Laser parameter extraction for tunable vertical cavity lasers

被引：1
|
作者：
Lin, CC [1 ]
Sugihwo, F [1 ]
Harris, JS [1 ]
机构：
[1] Stanford Univ, Solid State Elect Lab, Stanford, CA 94305 USA
来源：
ELECTRONICS LETTERS | 1997年 / 33卷 / 20期
关键词：
vertical cavity surface emitting lasers; laser variable measurement;
D O I：
10.1049/el:19971150
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A novel technique for extraction of diode laser parameters is demonstrated. With tunable vertical cavity surface emitting lasers (VCSELs), the internal quantum efficiency, internal loss, average gain coefficient, and transparent current density can be extracted on the same device. This technique enables evaluation of critical elements and design of VCSEL structures.
引用
收藏
页码：1705 / 1707
页数：3
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