Large-format, high-speed, X-ray pnCCDs combined with electron and ion imaging spectrometers in a multipurpose chamber for experiments at 4th generation light sources

被引:234
|
作者
Strueder, Lothar [1 ,2 ,5 ,8 ]
Eppa, Sascha [2 ]
Rolles, Daniel [2 ]
Hartmann, Robert [3 ,5 ]
Holl, Peter [3 ,5 ]
Lutz, Gerhard [3 ,5 ]
Soltau, Heike [3 ,5 ]
Eckart, Rouven [3 ,5 ]
Reich, Christian [3 ,5 ]
Heinzinger, Klaus [3 ,5 ]
Thamm, Christian [3 ,5 ]
Rudenko, Artem [2 ]
Krasniqi, Faton [2 ]
Kuehnel, Kai-Uwe [9 ]
Bauer, Christian [9 ]
Schroeter, Claus-Dieter [9 ]
Moshammer, Robert [2 ,9 ]
Techert, Simone [2 ,12 ]
Miessner, Danilo [1 ,5 ]
Porro, Matteo [1 ,5 ]
Haelker, Olaf [1 ,5 ]
Meidinger, Norbert [1 ,5 ]
Kimmel, Nils [1 ,5 ]
Andritschke, Robert [1 ,5 ]
Schopper, Florian [1 ,5 ]
Weidenspointner, Georg [1 ,5 ]
Ziegler, Alexander [1 ,5 ]
Pietschner, Daniel [1 ,5 ]
Herrmann, Sven [1 ,5 ]
Pietsch, Ullrich [8 ]
Walenta, Albert [8 ]
Leitenberger, Wolfram [8 ]
Bostedt, Christoph [6 ]
Moeller, Thomas [6 ]
Rupp, Daniela [6 ]
Adolph, Marcus [6 ]
Graafsma, Heinz [7 ]
Hirsemann, Helmut [7 ]
Gaertner, Klaus [10 ]
Richter, Rainer [4 ,5 ]
Foucar, Lutz [2 ]
Shoeman, Robert L. [11 ]
Schlichting, Ilme [2 ,11 ]
Ullrich, Joachim [2 ,9 ]
机构
[1] Max Planck Inst Extraterr Phys, D-85741 Garching, Germany
[2] Ctr Free Electron Laser Sci CFEL, Max Planck Adv Study Grp, D-22607 Hamburg, Germany
[3] PNSensor GmbH, D-80803 Munich, Germany
[4] Max Planck Inst Phys & Astrophys, D-80805 Munich, Germany
[5] Max Planck Inst Halbleiterlabor, D-81739 Munich, Germany
[6] Tech Univ Berlin, Inst Opt & Atomare Phys, D-10623 Berlin, Germany
[7] DESY, D-22607 Hamburg, Germany
[8] Univ Siegen, D-57068 Siegen, Germany
[9] Max Planck Inst Kernphys, D-69117 Heidelberg, Germany
[10] Weierstrass Inst, D-10117 Berlin, Germany
[11] Max Planck Inst Med Res, D-69120 Heidelberg, Germany
[12] Max Planck Inst Biophys Chem, D-37077 Gottingen, Germany
关键词
PnCCD; Parallel readout; Full depletion; Back illuminated; Radiation hard; Visible light; UV light and X-ray detection; CAMP chamber; Reaction microscope; Velocity map imaging; X-ray imaging; X-ray spectroscopy; Free electron laser; EXTREME-ULTRAVIOLET; LASER; DETECTOR;
D O I
10.1016/j.nima.2009.12.053
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Fourth generation accelerator-based light sources, such as VUV and X-ray Free Electron Lasers (FEL), deliver ultra-brilliant (similar to 10(12)-10(13) photons per bunch) coherent radiation in femtosecond ( 10100 fs) pulses and, thus, require novel focal plane instrumentation in order to fully exploit their unique capabilities. As an additional challenge for detection devices, existing (FLASH. Hamburg) and future FELs (LCLS, Menlo Park; SCSS, Hyogo and the European XFEL, Hamburg) cover a broad range of photon energies from the EUV to the X-ray regime with significantly different bandwidths and pulse structures reaching up to MHz micro-bunch repetition rates. Moreover, hundreds up to trillions of fragment particles, ions, electrons or scattered photons can emerge when a single light flash impinges on matter with intensities up to 10(22) W/cm(2). In order to meet these challenges, the Max Planck Advanced Study Group (ASG) within the Center for Free Electron Laser Science (CFEL) has designed the CFEL-ASG MultiPurpose (CAMP) chamber. It is equipped with specially developed photon and charged particle detection devices dedicated to cover large solid-angles. A variety of different targets are supported, such as atomic, (aligned) molecular and cluster jets, particle injectors for bio-samples or fixed target arrangements. CAMP houses 4 pi solid-angle ion and electron momentum imaging spectrometers ("reaction microscope", REMI, or "velocity map imaging", VMI) in a unique combination with novel, large-area, broadband (50 eV-25 keV), high-dynamic-range, single-photon-counting and imaging X-ray detectors based on the pnCCDs. This instrumentation allows a new class of coherent diffraction experiments in which both electron and ion emission from the target may be simultaneously monitored. This permits the investigation of dynamic processes in this new regime of ultra-intense, high-energy radiation matter interaction. After an introduction into the salient features of the CAMP chamber and the properties of the redesigned REMI/VMI spectrometers, the new 1024 x 1024 pixel format pnCCD imaging detector system will be described in detail. Results of tests of four smaller format (256 x 512) devices of identical performance, conducted at FLASH and BESSY, will be presented and the concept as well as the anticipated properties of the full, large-scale system will be elucidated. The data obtained at both radiation sources illustrate the unprecedented performance of the X-ray detectors, which have a voxel size of 75 x 75 x 4501 mu m(3) and a typical read-out noise of 2.5 electrons (rms) at an operating temperature of -50 degrees C. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:483 / 496
页数:14
相关论文
共 4 条
  • [1] Measurement of shock roughness due to phase plate speckle imprinting relevant for x-ray diffraction experiments on 3rd and 4th generation light sources
    Gorman, Martin G.
    Ali, Suzanne J.
    Celliers, Peter M.
    Peebles, Jonathan L.
    Erskine, David J.
    McNaney, James M.
    Eggert, Jon H.
    Smith, Raymond F.
    [J]. JOURNAL OF APPLIED PHYSICS, 2022, 132 (17)
  • [2] High-Speed X-ray Imaging with the Keck Pixel Array Detector (Keck PAD) for Time-Resolved Experiments at Synchrotron Sources
    Philipp, Hugh T.
    Tate, Mark W.
    Purohit, Prafull
    Chamberlain, Darol
    Shanks, Katherine S.
    Weiss, Joel T.
    Gruner, Sol M.
    [J]. PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION (SRI2015), 2016, 1741
  • [3] From 3rd- to 4th-generation light sources: Free-electron lasers in the X-ray range
    M. Altarelli
    [J]. Crystallography Reports, 2010, 55 : 1145 - 1151
  • [4] From 3rd-to 4th-generation light sources: Free-electron lasers in the X-ray range
    Altarelli, M.
    [J]. CRYSTALLOGRAPHY REPORTS, 2010, 55 (07) : 1145 - 1151