Simulation of EMC test environments

被引：0
|
作者：
Argyri, V [1 ]
Christopoulos, C [1 ]
机构：
[1] Univ Nottingham, Nottingham NG7 2RD, England
来源：
INTERNATIONAL CONFERENCE ON ELECTROMAGNETIC COMPATIBILITY | 1997年 / 445期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper describes work aimed at a better understanding of the sources of error in EMC tests taken in partially anechoic screened rooms. Two aspects are covered namely the characterization of screened rooms by simulation using the normalised site insertion loss, and, proximity effects on the impedance of test antennas.
引用
收藏
页码：164 / 169
页数：6
相关论文
共 50 条
  • [1] INEXPENSIVE EMC TEST ENVIRONMENTS
    PITCHFORD, G
    ELECTRONIC ENGINEERING, 1994, 66 (807): : 39 - 40
  • [2] EMC - test, measurement and simulation
    Wexler, Al
    Gant, Ernest P.
    Circuit Design, 1997, 14 (01): : 15 - 18
  • [3] A Review On Links Between Different EMC Test Environments In Medical Technologies
    Senevirathna, Nandun
    Kleihorst, Rob
    Roc'h, Anne
    2022 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC EUROPE 2022), 2022, : 834 - 839
  • [4] The Use of Equivalent Model and Numerical Simulation for EMC Analysis in Hospital Environments
    Valente, Wilson, Jr.
    Raizer, Adroaldo
    Pichon, Lionel
    IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 2016, 58 (04) : 950 - 955
  • [5] EMC test
    Test & Measurement World, 1995, 15 (02)
  • [6] Specifying lifecycle electromagnetic and physical environments - to help design and test for EMC for functional safety
    Armstrong, EK
    EMC 2005: IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, VOLS 1-3, PROCEEDINGS, 2005, : 495 - 500
  • [7] SIMULATION AND TEST-GENERATION ENVIRONMENTS WORKSHOP
    BOZORGUINESBAT, S
    LEE, W
    IEEE DESIGN & TEST OF COMPUTERS, 1985, 2 (06): : 75 - 76
  • [8] Emc test equipment
    New Electron, 6 (60):
  • [9] Update on EMC simulation
    Electron Des, 22 (93):
  • [10] Simulation for EMC compliance
    Quantic Lab of Canada
    Aust Electron Eng, 3 (3pp):
12345