X-ray Rietveld structure refinement of ErNiSb

被引：0
|
作者：
Zeng, LM
Yan, JL
Ou, XL
He, W
Zhuang, YH
机构：
[1] Guangxi Univ, Inst Sci Mat, Nanning 530004, Peoples R China
[2] Univ Sci & Technol China, Ctr Fundamental Phys, Hefei 230026, Peoples R China
来源：
TRANSACTIONS OF NONFERROUS METALS SOCIETY OF CHINA | 1998年 / 8卷 / 01期
关键词：
X-ray powder diffraction; rietveld analysis; structure refinement;
D O I：
暂无
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
The crystal structure of compound ErNiSb has been refined by the Rietveld whole-pattern-fitting method from X-ray powder diffraction data. The compound ErNiSb is cubic, space group <F(4)over bar 3m> and the structure parameters and reliability factors were refined to be a = 6.2683(1) Angstrom, V = 246.29 Angstrom(3), Z = 4, D-z = 9.377g/cm(3), R-B = 3.57%, R-F = 3.64%, R-P = 6.63%, R-WP = 8.80%.
引用
收藏
页码：18 / 19
页数：2
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