A note on the estimation of P(YX) in two-parameter exponential distributions

被引:11
|
作者
Chaturvedi, Ajit [1 ]
Sharma, Vandana [1 ]
机构
[1] Univ Delhi, Dept Stat, Delhi 110007, India
关键词
exponential distributions; stress-strength reliability; uniformly minimum variance unbiased estimators;
D O I
10.1080/02331880902760629
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
The problems of obtaining uniformly minimum variance unbiased estimators of =P(YX) and k (where k is a positive integer) when X and Y follow two-parameter exponential distributions considered by Pal et al. [M. Pal, M. Ali Masoom, and J. Woo, Estimation and testing of P(YX) in two parameter exponential distributions, Statistics 39 (2005), pp. 415-428] are revisited. Much simpler techniques of obtaining these estimators are provided.
引用
收藏
页码:73 / 75
页数:3
相关论文
共 50 条