Three-dimensional detection of defect technology based on single measurement image

被引:0
|
作者
Song, LM [1 ]
Zhou, XL [1 ]
Qu, XH [1 ]
He, JJ [1 ]
Ye, SH [1 ]
机构
[1] Tianjin Univ, State Key Lab Precis Measurement Technol & Instru, Tianjin 300072, Peoples R China
关键词
the detection of defect; SFS; tonal value; slant; tilt;
D O I
暂无
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
The detection of defect technology is an effective guarantee to improve the product quality. When adopting the former technology, such as the eddy current technology, the leakage of magnetic technology, the infrared technology, and the radial technology, which are too hard to expand widely, for their limitation of the working pattern, we'll surely face the difficulty of proceeding the three-dimensional overall detection of defect. This paper emphasizes particularly on the study of the three-dimensional overall detection of defect technology, which ensures the more comprehensive realization of the defect. Unlike other popular ways of three-dimensional study, this paper refers to the application of three-dimensional detection of defect which just according to the single image coming from real-time measurement of the workpiece. From the single image, we can get the three-dimensional data of the workpiece shape ranged from 0degrees to 180degrees. Moreover, it can give an overall recognition of plane dimensions and depth information of the defect. This technology focus on, according to the 3D cues-"shading value" information left by single measurement image, in the process of luminance analysis and conversion, acquiring the workpiece slant and tilt of every point's normal in the light source system of coordinates, and then transferring to the image system of coordinates, calculating the depth information by slant and tilt. Compared with the former three-dimensional shape recovery method based on single image, this method has great improvement on the design of optical system, such as improving three-dimensional recovery accuracy and speed, with the simplification of the arithmetic, and first apply it to the industrial environment detection of defect. The three-dimensional detection of defect method mentioned in this paper has advantages as follows: the simple working pattern and hardware configuration that just needs light source, CCD, image-collection card and computer, which greatly reduces the cost, and is fit to use in industrial application.
引用
收藏
页码:89 / 93
页数:5
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