A CMOS smart temperature sensor with a 3σ inaccuracy of ±0.5 °C from -50 °C to 120 °C

被引:85
|
作者
Pertijs, MAP [1 ]
Niederkorn, A
Ma, X
McKillop, B
Bakker, A
Huijsing, JH
机构
[1] Delft Univ Technol, Elect Instrumentat Lab, NL-2628 CD Delft, Netherlands
[2] Zoran Corp, Mesa, AZ 85210 USA
[3] Microchip Technol, Chandler, AZ 85224 USA
[4] On Semicond, Phoenix, AZ 85082 USA
[5] Analog Devices Inc, San Jose, CA 95134 USA
关键词
calibration; curvature correction; dynamic offset cancellation; smart sensors; temperature sensors;
D O I
10.1109/JSSC.2004.841013
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A low-cost temperature sensor with on-chip sigma-delta ADC and digital bus interface was realized in a 0.5 mum CMOS process. Substrate pup transistors are used for temperature sensing and for generating the ADC's reference voltage. To obtain a high initial accuracy in the readout circuitry, chopper amplifiers and dynamic element matching are used. High linearity is obtained by using second-order curvature correction. With these measures, the sensor's temperature error is dominated by spread on the base-emitter voltage of the imp transistors. This is trimmed after packaging by comparing the sensor's output with the die temperature measured using an extra on-chip, calibration transistor. Compared to traditional calibration techniques, this procedure is much faster and therefore reduces production costs. The sensor is accurate to within, +/-0.5degreesC (3sigma) from -50degreesC to 120degreesC.
引用
收藏
页码:454 / 461
页数:8
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