Error probability of binary phase shift keying in Nakagami-m fading channel with phase noise

被引：30

作者：

Lo, CM ^{[1
]}

Lam, WH ^{[1
]}

机构：

[1] Univ Hong Kong, Dept Elect & Elect Engn, Hong Kong, Peoples R China

来源：

ELECTRONICS LETTERS | 2000年 / 36卷 / 21期

关键词：

D O I：

10.1049/el:20001273

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The error performance of coherent detection of binary phase shift keying (BPSK) signals with noisy phase reference is analysed for a flat Nakagami-m fading channel and in the presence of additive white Gaussian noise (AWGN). By assuming Gaussian and Tikhonov probability density functions (PDFs) for the phase error, closed-form expressions for the average bit error rate (BER) are derived.

引用

页码：1773 / 1774

页数：2

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