Thermal conductivity of SiC after heavy ions irradiation

被引:27
|
作者
Cabrero, J. [1 ,2 ]
Audubert, F. [2 ]
Pailler, R. [1 ]
Kusiak, A. [3 ]
Battaglia, J. L. [3 ]
Weisbecker, P. [1 ]
机构
[1] Univ Bordeaux, LCTS, F-33600 Pessac, France
[2] CEA, DEN, DEC, SPUA, F-13108 St Paul Les Durance, France
[3] Univ Bordeaux, Lab Transferts Ecoulements Fluides Energet, F-33405 Talence, France
关键词
SILICON-CARBIDE; THIN DEPOSIT; DISPLACEMENT; IMPLANTATION; AMORPHIZATION; TEMPERATURE; RADIATION; CERAMICS; BEHAVIOR; DAMAGE;
D O I
10.1016/j.jnucmat.2009.11.006
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this study, we performed irradiation experiments on alpha-SiC samples, with heavy ions at room temperature (74 MeV Kr, fluence of 5 x 10(14) ions cm(-2)). This energy results in an irradiated layer of about 9.6 mu m for SiC. TEM and Raman analyses reveal a graded damaged material. In the electronic interactions domain SiC is weakly damaged whereas it becomes fully amorphous in the nuclear interactions domain. According to the structural examinations, the irradiated SiC is considered as a multilayered material. Thermal conductivity in both electronic and nuclear interactions domains is measured as a function of temperature and annealing temperature. It appears that such an approach is reliable to estimate thermal conductivity of ceramics under neutron irradiation. (C) 2009 Published by Elsevier B.V.
引用
收藏
页码:202 / 207
页数:6
相关论文
共 50 条
  • [1] TITANIUM CARBIDE AND SILICON CARBIDE THERMAL CONDUCTIVITY UNDER HEAVY IONS IRRADIATION
    Cabrero, J.
    Audubert, F.
    Weisbecker, P.
    Kusiak, A.
    Pailler, R.
    MECHANICAL PROPERTIES AND PERFORMANCE OF ENGINEERING CERAMICS AND COMPOSITES IV, 2010, 30 (02): : 205 - +
  • [2] Amorphization and reduction of thermal conductivity in porous silicon by irradiation with swift heavy ions
    Newby, Pascal J.
    Canut, Bruno
    Bluet, Jean-Marie
    Gomes, Severine
    Isaiev, Mykola
    Burbelo, Roman
    Termentzidis, Konstantinos
    Chantrenne, Patrice
    Frechette, Luc G.
    Lysenko, Vladimir
    JOURNAL OF APPLIED PHYSICS, 2013, 114 (01)
  • [3] Thermal diffusivity and thermal conductivity of SiC composite tubes: the effects of microstructure and irradiation
    Koyanagi, Takaaki
    Wang, Hsin
    Mena, Jose' D. Arregui
    Petrie, Christian M.
    Deck, Christian P.
    Kim, Weon-Ju
    Kim, Daejong
    Sauder, Cedric
    Braun, James
    Katoh, Yutai
    JOURNAL OF NUCLEAR MATERIALS, 2021, 557
  • [4] Irradiation of 4H-SiC UV detectors with heavy ions
    E. V. Kalinina
    A. A. Lebedev
    E. Bogdanova
    B. Berenquier
    L. Ottaviani
    G. N. Violina
    V. A. Skuratov
    Semiconductors, 2015, 49 : 540 - 546
  • [5] Irradiation of 4H-SiC UV detectors with heavy ions
    Kalinina, E. V.
    Lebedev, A. A.
    Bogdanova, E.
    Berenquier, B.
    Ottaviani, L.
    Violina, G. N.
    Skuratov, V. A.
    SEMICONDUCTORS, 2015, 49 (04) : 540 - 546
  • [6] Effects of irradiation and post-irradiation annealing on the thermal conductivity/diffusivity of monolithic SiC and f-SiC/SiC composites
    Youngblood, GE
    Senor, DJ
    Jones, RH
    JOURNAL OF NUCLEAR MATERIALS, 2004, 329 : 507 - 512
  • [7] Effect of swift heavy ions irradiation in the migration of silver implanted into polycrystalline SiC
    Abdelbagi, H. A. A.
    Skuratov, V. A.
    Motloung, S. V.
    Njoroge, E. G.
    Mlambo, M.
    Malherbe, J. B.
    O'Connell, J. H.
    Hlatshwayo, T. T.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2019, 461 : 201 - 209
  • [8] Preliminary studies on the emulation of 14 MeV neutron irradiation in SiC with heavy ions
    Guo, Daxi
    Zang, Hang
    He, Chaohui
    Zhang, Peng
    Li, Tao
    Cao, Xingqing
    Ma, Li
    FUSION ENGINEERING AND DESIGN, 2015, 100 : 274 - 279
  • [9] Neutrons and swift heavy ions irradiation induced damage in SiC single crystal
    Akel, Fatima Zohra
    Izerrouken, Mahmoud
    Belgaid, Mohamed
    MATERIALS TODAY COMMUNICATIONS, 2023, 37
  • [10] Thermal damage in SiC Schottky diodes induced by SE heavy ions
    Abbate, C.
    Busatto, G.
    Cova, P.
    Delmonte, N.
    Giuliani, F.
    Iannuzzo, F.
    Sanseverino, A.
    Velardi, F.
    MICROELECTRONICS RELIABILITY, 2014, 54 (9-10) : 2200 - 2206