Silicon solar cells and modules with front contact paste containing copper-based component

被引:9
|
作者
Gawlinska-Necek, Katarzyna [1 ]
Socha, Robert P. [2 ]
Balawender, Pawel [2 ]
Stodolny, Maciej K. [3 ]
Van Aken, Bas B. [4 ]
Starowicz, Zbigniew [1 ]
Panek, Piotr [1 ]
机构
[1] Polish Acad Sci, Inst Met & Mat Sci, Reymonta 25, PL-30059 Krakow, Poland
[2] Res & Dev Ctr Technol Ind, Ludwika Warynskiego 3A, PL-00645 Warsaw, Poland
[3] Shell Global Solut Int, New Energies Res & Technol, NL-1031 HW Amsterdam, Netherlands
[4] TNO Energy Transit, Solar Energy, Westerduinweg 3, NL-1755 LE Petten, Netherlands
来源
PROGRESS IN PHOTOVOLTAICS | 2021年 / 29卷 / 09期
关键词
copper metallization; diffusion barrier coating; front metallization; silicon solar cell;
D O I
10.1002/pip.3424
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
In this article, we present the results of aging tests of silicon photovoltaic modules with a copper-containing electrode deposited in one-step screen printing method. For front metallization, a mixture of commercial silver paste with copper filler was used, where copper constituted 30% of total paste volume. The filler is based on copper particles about 1 mu m of diameter covered with a protective coating layer based on nickel (CCu1) or nickel-silver (CCu2). For the first time, Si solar cells with screen-printed front electrode containing massive copper with efficiency over 20% are reported. Aging tests included 2000 h of damp heat (DH) and 400 times of thermal cycling (TC) tests. TC results are very promising and provide slight deterioration of the electrical parameters of the modules with both CCu1 and CCu2. Greater decreases were found when performed DH tests, but it is worth pointing out that mainly fill factor (FF) and eta have fallen while V-oc and I-sc did not change by more than 5% for both pastes. After 2000 h of the test, FF decreased by 28% for CCu1 and 37.4% for CCu2, whereas the efficiency deteriorated by 32% and 42.6% for CCu1 and CCu2. The electroluminescence (EL) and X-ray photoelectron spectroscopy (XPS) measurements suggest that decrease in electrical parameters is a consequence of Cu corrosion caused by harmful products of the decomposed EVA laminating film.
引用
收藏
页码:1008 / 1019
页数:12
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