High-resolution differential optical reflectivity measurements of freestanding liquid-crystal films

被引：13
|
作者：
Pankratz, S [1 ]
Johnson, PM [1 ]
Huang, CC [1 ]
机构：
[1] Univ Minnesota, Sch Phys & Astron, Minneapolis, MN 55455 USA
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2000年 / 71卷 / 08期
关键词：
D O I：
10.1063/1.1305520
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A differential optical reflectivity measurement technique for freestanding films is presented. The system is highly sensitive to changes in the polarization state of the reflected light. The method is used to study the evolution of an optically anisotropic liquid crystalline structure with temperature. In addition we present a reflectivity method for determining the film thickness for films consisting of two to hundreds of layers. (C) 2000 American Institute of Physics. [S0034-6748(00)04108-3].
引用
收藏
页码：3184 / 3187
页数：4
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