In this paper, the influence caused by the fundamental incident wave partition numbers at both input and output ports for canonical section-wise piecewise linear (CSWPL) function based large-signal behavioral model, is analyzed and discussed. The basic theory about the CSWPL model is presented, along with the detail modeling procedure for RF power transistors. Simulation test examples of a 10 W GaN HEMT, are given in this work The model performance with different partition numbers for both fundamental incident wave at input and output ports, K and J, are analyzed and compared, for the linear, weakly nonlinear and strong nonlinear regions, respectively. The results show that the influence of the number of partitions for the incident wave at input port is greater than the output port.
机构:
Yonsei Univ, Dept Elect & Elect Engn, High Speed Circuits & Syst Lab, Seoul 03722, South KoreaYonsei Univ, Dept Elect & Elect Engn, High Speed Circuits & Syst Lab, Seoul 03722, South Korea
Kim, Kihun
Kim, Jun-Seo
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Yonsei Univ, Dept Elect & Elect Engn, High Speed Circuits & Syst Lab, Seoul 03722, South Korea
Qualitas Semicond Co Ltd, Seongnam 13558, South KoreaYonsei Univ, Dept Elect & Elect Engn, High Speed Circuits & Syst Lab, Seoul 03722, South Korea
Kim, Jun-Seo
Kim, Jae-Young
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Qualitas Semicond Co Ltd, Seongnam 13558, South KoreaYonsei Univ, Dept Elect & Elect Engn, High Speed Circuits & Syst Lab, Seoul 03722, South Korea
Kim, Jae-Young
Choi, Woo-Young
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Yonsei Univ, Dept Elect & Elect Engn, High Speed Circuits & Syst Lab, Seoul 03722, South KoreaYonsei Univ, Dept Elect & Elect Engn, High Speed Circuits & Syst Lab, Seoul 03722, South Korea