Measurement of gain curves for semiconductor optical amplifier utilizing hakki-paoli method with wavelet denoise and deconvolution process

被引:0
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作者
Liu, Lei [1 ]
Zhang, Xinliang [1 ]
Huang, Dexiu [1 ]
机构
[1] Huazhong Univ Sci & Technol, Inst Optoelect Sci & Engn, Wuhan Natl Lab Optoelect, Wuhan 430074, Hubei, Peoples R China
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
For improved the precision of the measurement result of the gain coefficient and avoid the affection of the optical spectrum analyzer's resolution and noise, we combined the Hakki-Paoli method with the wavelet denoise and deconvolution process. It was testified from the simulation that this method improve the precision of the gain coefficient measurement. At last, the conclusion was testified from the experiment.
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页码:68 / +
页数:2
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